The Influence of Water Absorbed in Grain Boundary of a Polycrystalline NiO Layer on the Memory Characteristics of Pt/NiO/Pt Resistive Random Access Memory (ReRAM)
Ogata, Ryosuke, Yoshihara, Masataka, Murayama, Naohiro, Kishida, Satoru, Kinoshita, KentaroVolume:
1691
Year:
2014
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/opl.2014.792
File:
PDF, 668 KB
english, 2014