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Complex Permittivity Determination of Thin-Films Through RF-Measurements of a MIM Capacitor
Sejas-Garcia, Svetlana C., Torres-Torres, Reydezel, Valderrama-B., Rene, Molina, JoelVolume:
24
Language:
english
Journal:
IEEE Microwave and Wireless Components Letters
DOI:
10.1109/lmwc.2014.2348179
Date:
November, 2014
File:
PDF, 686 KB
english, 2014