[ECS 214th ECS Meeting - Honolulu, HI (October 12 - October 17, 2008)] ECS Transactions - EIS Characterization of Ultra High Purity, Float Zone Single Crystal Silicon
Viscor, Petr, Andersen, Ole, Clausen, Thomas, Ellsmore, Paul A., Jensen, Leif, Schiotz, JakobVolume:
16
Year:
2008
Language:
english
DOI:
10.1149/1.2980316
File:
PDF, 583 KB
english, 2008