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X-ray diffraction line broadening effects in MBa2Cu3O7−δ (M = Y, Gd) thin films
Scardi, P., Matacotta, F. C., Dediu, V. I., Correra, L.Volume:
12
Language:
english
Journal:
Journal of Materials Research
DOI:
10.1557/JMR.1997.0007
Date:
January, 1997
File:
PDF, 336 KB
english, 1997