X-ray diffraction line broadening effects in MBa2Cu3O7−δ (M...

Journal of Materials Research 1997 / 1 Vol. 12; Iss. 1

X-ray diffraction line broadening effects in MBa2Cu3O7−δ (M = Y, Gd) thin films

Scardi, P., Matacotta, F. C., Dediu, V. I., Correra, L.
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Volume:
12
Language:
english
Journal:
Journal of Materials Research
DOI:
10.1557/JMR.1997.0007
Date:
January, 1997
File:
PDF, 336 KB
english, 1997
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