Doped Tin Oxide Nanometric Films for Environment Monitoring
Falla, P. Hidalgo, Peres, H.E.M., Gouvêa, Douglas, Ramirez-Fernandez, F.J.Volume:
498-499
Year:
2005
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.498-499.636
File:
PDF, 363 KB
english, 2005