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Diffractometer with a Curved PSD for Analysis of Polycrystalline Microsamples
Goganov, D.A., Ageev, O.I., Reizis, B.M.Volume:
79-82
Year:
1991
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.79-82.339
File:
PDF, 201 KB
1991