Laser Pulsed Induced Microwave Conductivity and...

Laser Pulsed Induced Microwave Conductivity and Spectroscopic Ellipsometry Characterization of Helium and Hydrogen Plasma Damage of the Crystalline Silicon Surface

Neitzert, H.C., Layadi, N., Roca i Cabarrocas, Pere, Vanderhaghen, R., Kunst, M.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
173-174
Year:
1995
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.173-174.209
File:
PDF, 407 KB
1995
Conversion to is in progress
Conversion to is failed