Comparative Analysis of Light Emitting Properties of Si: Er and Ge/Si1-xGex Epitaxial Structures Obtained by MBE Method
Orlov, L.K., Potapov, A.V., Ivina, N.L., Steinman, E.A., Vdovin, V.I.Volume:
69-70
Year:
1999
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.69-70.377
File:
PDF, 401 KB
1999