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Nanocrystalline Si Studied by Beam-Based Positron Annihilation Spectroscopy
Coleman, Paul G., Pi, X.D., Gwilliam, Russell, Sealy, Brian J.Volume:
445-446
Year:
2004
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.445-446.66
File:
PDF, 271 KB
english, 2004