Study of Electronic Properties by Persistent...

Japanese Journal of Applied Physics 2005 / 4 Vol. 44; Iss. 4B

Study of Electronic Properties by Persistent Photoconductivity Measurement in Ga x In 1- x N y As 1- y Grown by MOCVD

Hsu, S. H., Su, Y. K., Chuang, R. W., Chang, S. J., Chen, W. C., Chen, W. R.
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Volume:
44
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.44.2454
Date:
April, 2005
File:
PDF, 147 KB
english, 2005
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