Application of X-Ray and Neutron Diffraction Methods to Reliability Evaluation of Structural Components and Electronic Device
Hayashi, Makoto, Okido, ShinobuVolume:
490-491
Year:
2005
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.490-491.19
File:
PDF, 399 KB
english, 2005