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Determination of Ge Fraction and Carrier Concentration in Si1-XGex/Si by Capacitance-Voltage Method
Cheng, Li Hong, Yu, L., Yu, F., Lu, Z.Z., Zhao, Xiang Fu, Han, Ping, Zhao, H., Xie, Z.L., Xiu, X.Q., Zhang, R., Zheng, Y.D.Volume:
295-297
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/AMR.295-297.1568
Date:
July, 2011
File:
PDF, 1.49 MB
english, 2011