A Crack in an Electrode Layer between Two Dissimilar Piezoelectric Materials
Beom, Hyeon Gyu, Kim, Y.H., Yoon, C.K., Cho, Chong DuVolume:
353-358
Year:
2007
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.353-358.231
File:
PDF, 252 KB
english, 2007