Texture Analysis of Ferroelectric Thin Films on Platinised...

Materials Science Forum 2002 Vol. 408-412

Texture Analysis of Ferroelectric Thin Films on Platinised Si-Based Substrates with a TiO2 Layer

Ricote, Jesús, Morales, M., Calzada, M.L.
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Volume:
408-412
Year:
2002
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.408-412.1543
File:
PDF, 483 KB
2002
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