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[IEEE 2010 2nd International Conference on Signal Processing Systems (ICSPS) - Dalian, China (2010.07.5-2010.07.7)] 2010 2nd International Conference on Signal Processing Systems - The applicaion of curve fitting technique in fabric defect detection
Guo-sheng, XuYear:
2010
Language:
english
DOI:
10.1109/icsps.2010.5555595
File:
PDF, 242 KB
english, 2010