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Avalanche Breakdown Energy in Silicon Carbide Junction Field Effect Transistors
Hinojosa, Miguel, Bayne, Stephen, Veliadis, Victor, Urciuoli, DamianVolume:
717-720
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.717-720.1025
Date:
May, 2012
File:
PDF, 379 KB
english, 2012