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[IEEE 2007 IEEE International Electron Devices Meeting - Washington, DC, USA (2007.12.10-2007.12.12)] 2007 IEEE International Electron Devices Meeting - Mobility Enhancement in Uniaxially Strained (110) Oriented Ultra-Thin Body Single- and Double-Gate MOSFETs with SOI Thickness of Less Than 4 nm
Shimizu, Ken, Hiramoto, ToshiroYear:
2007
Language:
english
DOI:
10.1109/IEDM.2007.4419046
File:
PDF, 3.53 MB
english, 2007