ECS Transactions [ECS China Semiconductor Technology International Conference 2010 (CSTIC 2010) - Shanghai, China (March 18 - March 19, 2010)] - The Impact of Different Stress Condition Combinations on Parameters Estimations in Electromigration Tests
Ma, Jinyi J., Wang, Xiaotao J., Gong, Excimer B., Chang, VensonYear:
2010
Language:
english
DOI:
10.1149/1.3360629
File:
PDF, 206 KB
english, 2010