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The Influence of the Hafnium Doping on Negative Bias Stability in Zinc Oxide Thin Film Transistor
Kim, Woong-Sun, Moon, Yeon-Keon, Kim, Kyung-Taek, Shin, Sae-Young, Du Ahn, Byung, Lee, Je-Hun, Park, Jong-WanVolume:
13
Year:
2010
Language:
english
Journal:
Electrochemical and Solid-State Letters
DOI:
10.1149/1.3447862
File:
PDF, 410 KB
english, 2010