Effect of Electron Leakage on Efficiency Droop in Wide-Well InGaN-Based Light-Emitting Diodes
Chang, Liann-Be, Lai, Mu-Jen, Lin, Ray-Ming, Huang, Chou-HsiungVolume:
4
Language:
english
Journal:
Applied Physics Express
DOI:
10.1143/apex.4.012106
Date:
January, 2011
File:
PDF, 705 KB
english, 2011