Microscopic Investigation of a Copper Molten Mark by...

Procedia Engineering 2011 Vol. 11; Iss. none

Microscopic Investigation of a Copper Molten Mark by Optical Microscopy (OM) and Atomic Force Microscopy (AFM)

GAO Ao, ZHAO Chang-zheng, DI Man, GAO Wei, ZHANG Ming, XIA Da-wei
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Volume:
11
Year:
2011
Language:
english
Pages:
7
DOI:
10.1016/j.proeng.2011.04.633
File:
PDF, 556 KB
english, 2011
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