Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
2015 / 03 Vol. 33; Iss. 2
Controlling the tunnel resistance of suspended Ni nanogaps using field-emission-induced electromigration
Toyonaka, Takahiro, Morihara, Kohei, Takikawa, Kazuki, Ito, Mitsuki, Shirakashi, Jun-ichiVolume:
33
Language:
english
Journal:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
DOI:
10.1116/1.4904731
Date:
March, 2015
File:
PDF, 1.31 MB
english, 2015