X-ray Raman scattering at the edge of manganese compounds: Characteristic behaviour of and
José Jiménez-Mier, D.L. Ederer, T. SchulerVolume:
75
Year:
2006
Language:
english
Pages:
4
DOI:
10.1016/j.radphyschem.2005.07.023
File:
PDF, 205 KB
english, 2006