Microstructure, electrical properties, and thermal...

Journal of Materials Research 1997 / 9 Vol. 12; Iss. 9

Microstructure, electrical properties, and thermal stability of Au-based ohmic contacts to p-GaN

Smith, L. L., Davis, R. F., Kim, M. J., Carpenter, R. W., Huang, Y.
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Volume:
12
Language:
english
Journal:
Journal of Materials Research
DOI:
10.1557/JMR.1997.0300
Date:
September, 1997
File:
PDF, 276 KB
english, 1997
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