Transient Voltage-Induced Leakage Current in Power Diode with Semi-Insulating Polycrystalline Silicon Resistive Field Plate
Yahata, Akihiro, Atsuta, MasakiVolume:
35
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.35.2595
Date:
May, 1996
File:
PDF, 510 KB
1996