Synchrotron X-ray Topographic Analysis of Dislocation...

Materials Science Forum 2006 Vol. 527-529

Synchrotron X-ray Topographic Analysis of Dislocation Structures in Bulk SiC Single Crystal

Yamaguchi, Satoshi, Nakamura, Daisuke, Gunjishima, Itaru, Hirose, Yoshiharu
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Volume:
527-529
Year:
2006
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.527-529.407
File:
PDF, 870 KB
english, 2006
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