X-Ray Diffraction Line Profile Analysis of Neutron...

Materials Science Forum 2001 Vol. 353-356

X-Ray Diffraction Line Profile Analysis of Neutron Irradiated 6H-SiC

Seitz, Christoph, Magerl, Andreas, Heissenstein, Hans, Helbig, Reinhard
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Volume:
353-356
Year:
2001
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.353-356.287
File:
PDF, 320 KB
2001
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