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Quantitative Electron-probe Microanalysis and WDS Background Measurement
Carpenter, P. K., Donovan, J. J.Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614005339
Date:
August, 2014
File:
PDF, 1.79 MB
english, 2014