Characterization of SiC MESFETs on Conducting Substrates

Materials Science Forum 2000 Vol. 338-342

Characterization of SiC MESFETs on Conducting Substrates

Nilsson, Per Åke, Saroukhan, A.M., Svedberg, J.O., Konstantinov, Andrey O., Karlsson, S., Adås, C., Gustafsson, U., Harris, Chris I., Rorsman, Niklas, Eriksson, Joakim, Zirath, Herbert
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Volume:
338-342
Year:
2000
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.338-342.1255
File:
PDF, 301 KB
2000
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