Characterization of Oxide Films on SiC Epitaxial (000-1) Faces by Angle-Resolved Photoemission Spectroscopy Measurements Using Synchrotron Radiation
Hijikata, Yasuto, Yaguchi, Hiroyuki, Yoshida, Sadafumi, Takata, Y., Kobayashi, K., Shin, S., Nohira, H., Hattori, TakeshiVolume:
483-485
Year:
2005
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.483-485.585
File:
PDF, 293 KB
english, 2005