Characterization of the Microstructure of Severely Deformed...

Materials Science Forum 2003 Vol. 414-415

Characterization of the Microstructure of Severely Deformed Titanium by X-Ray Diffraction Profile Analysis

Gubicza, Jenő, Dragomir, Iuliana C., Ribárik, Gábor, Zhu, Yuntian T., Valiev, Ruslan Z., Ungár, Tamás
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
414-415
Year:
2003
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.414-415.229
File:
PDF, 251 KB
english, 2003
Conversion to is in progress
Conversion to is failed