Electron channelling contrast imaging of interfacial...

Electron channelling contrast imaging of interfacial defects in strained silicon-germanium layers on silicon

Wilkinson, A. J., Anstis, G. R., Czernuszka, J. T., Long, N. J., Hirsch, P. B.

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Volume:

Language:

english

Journal:

Philosophical Magazine A

DOI:

10.1080/01418619308219357

Date:

July, 1993

File:

PDF, 1.29 MB

english, 1993

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