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A Survey of Diagnosis Method for Interconnect in SRAM-Based FPGAs
Zhang, Jie, Zhang, Na, Zhu, Xu Ming, Guan, Yong, Liu, Yong MeiVolume:
474-476
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.474-476.1949
Date:
April, 2011
File:
PDF, 314 KB
english, 2011