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Simultaneous process self-calibration method using TDC for 3D DDR4 DRAM
Oh, Reum, Kim, J., Sung, Man Young, Jang, J.Volume:
50
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el.2014.1595
Date:
October, 2014
File:
PDF, 295 KB
english, 2014