Application of the Rietveld Method to XRD Patterns of Thin...

Application of the Rietveld Method to XRD Patterns of Thin Films Recorded in Parallel Beam Geometry

Pitschke, W.
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Volume:
228-231
Year:
1996
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.228-231.171
File:
PDF, 399 KB
1996
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