![](/img/cover-not-exists.png)
In Situ Electrical Probing by TEM-STM: Instrumentation and Applications for Nanocharacterization
Grimaud, Christële M, Lourie, Oleg RVolume:
10
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604881431
Date:
August, 2004
File:
PDF, 347 KB
english, 2004