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[ECS 2007 International Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors (ULSIC vs. TFT) - Barga, Italy (July 28 - August 3, 2007)] ECS Transactions - Device Performance and Reliability of Fully Developed SOI Transistors and Low-Temperature Poly-Si TFTs
Matsumura, Mieko, Hatano, Mutsuko, Hamamura, Hirotaka, Mitsuharu, Tai, Toyota, Yoshiaki, Ohkura, MakotoVolume:
8
Year:
2007
Language:
english
DOI:
10.1149/1.2767283
File:
PDF, 536 KB
english, 2007