Amorphous Bimetal Interface as a Testing Medium for Spatial Resolution of EDX Microanalysis
Csach, Kornel, Ocelík, Vašek, Miskuf, J., Duhaj, P.Volume:
81-83
Year:
1993
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.81-83.601
File:
PDF, 326 KB
1993