Reliability Evaluation of 4H-SiC JFETs Using I-V...

Materials Science Forum 2013 / 1 Vol. 740-742

Reliability Evaluation of 4H-SiC JFETs Using I-V Characteristics and Low Frequency Noise

Chan, Hua Khee, Stevens, Rupert C., Goss, Jonathan P., Wright, Nicholas G., Horsfall, Alton B.
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Volume:
740-742
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.740-742.934
Date:
January, 2013
File:
PDF, 808 KB
english, 2013
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