Optical Characterization of SiC Materials: Bulk and...

Materials Science Forum 2001 Vol. 353-356

Optical Characterization of SiC Materials: Bulk and Implanted Layers

Camassel, Jean, Vicente, Patrice, Falkovski, L.
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Volume:
353-356
Year:
2001
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.353-356.335
File:
PDF, 424 KB
2001
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