Nanoscale Characterization of SiC Interfaces and Devices
Giannazzo, Filippo, Fiorenza, Patrick, Saggio, Mario, Roccaforte, FabrizioVolume:
778-780
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.778-780.407
Date:
February, 2014
File:
PDF, 396 KB
english, 2014