Variation-Aware Comparative Study of 10-nm GAA Versus...

IEEE Transactions on Electron Devices 2014 / 12 Vol. 61; Iss. 12

Variation-Aware Comparative Study of 10-nm GAA Versus FinFET 6-T SRAM Performance and Yield

Zheng, Peng, Liao, Yi-Bo, Damrongplasit, Nattapol, Chiang, Meng-Hsueh, Liu, Tsu-Jae King
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Volume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2014.2360351
Date:
December, 2014
File:
PDF, 3.02 MB
english, 2014
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