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Visible and Deep Ultraviolet Study of SiC/SiO2 Interface
Borowicz, Pawel, Gutt, Tomasz, Malachowski, Tomasz, Latek, MariuszVolume:
711
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.711.118
Date:
January, 2012
File:
PDF, 418 KB
english, 2012