Rapid structural and chemical characterization of ternary...

Rapid structural and chemical characterization of ternary phase diagrams using synchrotron radiation

Specht, E. D., Rar, A., Pharr, G. M., George, E. P., Zschack, P., Hong, H., Ilavsky, J.
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Volume:
18
Language:
english
Journal:
Journal of Materials Research
DOI:
10.1557/JMR.2003.0351
Date:
October, 2003
File:
PDF, 234 KB
english, 2003
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