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Rapid structural and chemical characterization of ternary phase diagrams using synchrotron radiation
Specht, E. D., Rar, A., Pharr, G. M., George, E. P., Zschack, P., Hong, H., Ilavsky, J.Volume:
18
Language:
english
Journal:
Journal of Materials Research
DOI:
10.1557/JMR.2003.0351
Date:
October, 2003
File:
PDF, 234 KB
english, 2003