[IEEE 2014 IEEE 12th International Conference on Solid -State and Integrated Circuit Technology (ICSICT) - Guilin, China (2014.10.28-2014.10.31)] 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Area overhead reduction for small-delay defect detection using on-chip delay measurement
Zhang, Wenpo, Namba, Kazuteru, Ito, HideoYear:
2014
Language:
english
DOI:
10.1109/icsict.2014.7021171
File:
PDF, 1.11 MB
english, 2014