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Evaluating the Three Common SiC Polytypes for MESFET Applications
Roschke, M., Schwierz, F., Paasch, G., Schipanski, D.Volume:
264-268
Year:
1998
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.264-268.965
File:
PDF, 346 KB
1998