The Cryogenic Testing and Characterisation of SiC Diodes

Materials Science Forum 2014 / 2 Vol. 778-780

The Cryogenic Testing and Characterisation of SiC Diodes

Gammon, Peter M., Fisher, Craig A., Shah, Vishal A., Jennings, Mike R., Pérez-Tomás, Amador, Burrows, Susan E., Myronov, Maksym, Leadley, David R., Mawby, Phil A.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
778-780
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.778-780.863
Date:
February, 2014
File:
PDF, 3.19 MB
english, 2014
Conversion to is in progress
Conversion to is failed