![](/img/cover-not-exists.png)
Assessment of GaN Surface Pretreatment for Atomic Layer Deposited High- k Dielectrics
Nepal, Neeraj, Garces, Nelson Y., Meyer, David J., Hite, Jennifer K., Mastro, Michael A., Eddy, Jr., Charles R.Volume:
4
Language:
english
Journal:
Applied Physics Express
DOI:
10.1143/apex.4.055802
Date:
May, 2011
File:
PDF, 1.48 MB
english, 2011