Contactless Electrical Defect Characterization and...

Materials Science Forum 2007 Vol. 556-557

Contactless Electrical Defect Characterization and Topography of a-Plane Grown Epitaxial Layers

Wagner, Matthias, Mustafa, E., Hahn, S., Syväjärvi, Mikael, Yakimova, Rositza, Jang, S., Sakwe, Sakwe Aloysius, Wellmann, Peter J.
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Volume:
556-557
Year:
2007
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.556-557.327
File:
PDF, 2.08 MB
2007
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