Radiation Induced Defect Levels in Highly Doped n-Type Si1-xGex Strained Layers
Monakhov, Edouard V., Kuznetsov, Andrej Yu., Radamson, H.H., Svensson, Bengt G.Volume:
69-70
Year:
1999
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.69-70.185
File:
PDF, 478 KB
1999